Depth profiling study of in situ CdCl2 treated CdTe/CdS heterostructure with glancing angle incidence X-ray diffraction

• Published in: Thin solid films Vol. 450; no. 2; pp. 255 - 260
• Main Authors: VAMSI KRISHNA, K, DUTTA, V
• Format: Journal Article
• Language: English
• Published: Lausanne Elsevier Science 01-03-2004
• Subjects: Condensed matter: structure, mechanical and thermal properties; Cross-disciplinary physics: materials science; rheology; Exact sciences and technology; Liquid phase epitaxy; deposition from liquid phases (melts, solutions, and surface layers on liquids); Materials science; Methods of deposition of films and coatings; film growth and epitaxy; Physics; Single-crystal and powder diffraction; Spray coating techniques; Structure of solids and liquids; crystallography; X-ray diffraction and scattering; Inorganic compounds; Spray pyrolysis; 81.05.Dz; Cadmium sulfides; Polycrystals; XRD; Thin films; Cadmium tellurides; Crystal growth from solutions; X-Ray diffraction; Depth profiles; CdCl2 treatment; Scanning electron microscopy; Pyrolysis; 61.10.-i CdS/CdTe; Grain growth; Scattering; Spray coatings; Transition element compounds; Binary compounds; 68.55.-a; 81.15.Rs; Experimental study; Depth profiling; Stress; Compressive stress; Tensile stress; II-VI semiconductors; Shear stress; Incidence angle; Heterostructures
• ISSN: 0040-6090; 1879-2731
• DOI: 10.1016/j.tsf.2003.11.110