Automatic Generation of Water Distribution Networks Using Central Street Lines

• Published in: Water resources management Vol. 38; no. 4; pp. 1225 - 1240
• Main Authors: Frota, Artemisa Fontinele, Costa, Luis Henrique Magalhães, de Abreu Costa, José Nilton, de Castro, Marco Aurélio Holanda
• Format: Journal Article
• Language: English
• Published: Dordrecht Springer Netherlands 01-03-2024; Springer Nature B.V
• Subjects: Algorithms; Atmospheric Sciences; Civil Engineering; Computing time; Distribution; Earth and Environmental Science; Earth Sciences; Environment; Geotechnical Engineering & Applied Earth Sciences; Hydrogeology; Hydrology/Water Resources; Layouts; Parametric equations; Water distribution; Water engineering; EPANET; Layout WDN; Street centerline extraction; CAD; Parametric equations of lines
• ISSN: 0920-4741; 1573-1650
• DOI: 10.1007/s11269-023-03717-4

This paper introduces a dedicated algorithm for the automatic generation of water distribution network (WDN) layouts in EPANET, utilizing exclusively the street layout information contained in CAD files. The methodology involves reading and converting all elements constituting street boundaries into lines, which are then mathematically processed through parametric equations of lines. Subsequently, the central street lines are extracted and extended to generate intersection points. These points are then employed to define the network nodes, and, upon verifying connectivity among them, the pipes are automatically generated. The model's efficacy was evaluated on two distinct street layouts, and for both, the algorithm exhibited satisfactory results, automatically generating 100% of the network layout in EPANET input file. The model demonstrated swift performance for the considered layouts, with an average execution time of only 0.30 s. Furthermore, a comparison was conducted with the results obtained by the model proposed by Costa and Rodrigues (Water Resour Manage 35:1299–1319, 
2021
), with the performance of the model proposed in this work proving superior in both layout quality and computational time.