The features of identifying lines in a diffraction image formed by a widely divergent X-ray beam

• Published in: Crystallography reports Vol. 54; no. 3; pp. 386 - 390
• Main Authors: Avetyan, K. T., Levonyan, L. V., Arakelyan, M. M., Semerjian, H. S., Grigoryan, P. A., Hovhannisyan, G. M.
• Format: Journal Article
• Language: English
• Published: Dordrecht SP MAIK Nauka/Interperiodica 01-05-2009
• Subjects: ASYMMETRY; BEAMS; CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; CRYSTAL STRUCTURE; Crystallography and Scattering Methods; CRYSTALS; DIFFRACTION; Diffraction and Scattering of Ionizing Radiations; PHOTOGRAPHY; Physics; Physics and Astronomy; RELIABILITY; VECTORS; X RADIATION; 61.10.-i; 61.10.Eq; 61.10.Nz; 78.70 Ck
• ISSN: 1063-7745; 1562-689X
• DOI: 10.1134/S1063774509030043

A method for identifying lines in a diffraction image formed by a widely divergent X-ray beam and a technique for measuring the crystal structure parameters in the case of asymmetric crystal position have been developed. It is established that, once the distances between a crystal and a photographic plate and between the points of intersection of the hyperbola branches in a diffraction image are known, one can determine the angle between the crystal’s zone axis and the wave vector, which leads to multiwave diffraction. Relations linking this angle with the parameters of two atomic planes are obtained. It is found that, to measure the parameters of atomic planes belonging to a given zone, one can use different sets of crossed hyperbolas formed by radiations
K
α
and
K
β
. The measurements and calculations performed for the same sample (Si crystal), mounted symmetrically and asymmetrically, confirm the reliability of the proposed method.