Experimental and simulation investigations of the peculiarities of relativistic electron beam scattering at a small angle of incidence on a thin flat target

• Published in: Surface investigation, x-ray, synchrotron and neutron techniques Vol. 11; no. 5; pp. 987 - 993
• Main Authors: Serov, A. V., Koltsov, A. V., Mamonov, I. A.
• Format: Journal Article
• Language: English
• Published: Moscow Pleiades Publishing 01-09-2017; Springer Nature B.V
• Subjects: Aluminum; Angle of reflection; Bimetals; Chemistry and Materials Science; Computer simulation; Copper; Electron beams; Electron trajectories; Foils; Image processing; Incidence angle; Materials Science; Monte Carlo simulation; Particle physics; Particle trajectories; Pictures; Reflection; Refraction; Relativism; Scattering; Surfaces and Interfaces; Thin Films; relativistic electrons; refraction; reflection; foil
• ISSN: 1027-4510; 1819-7094
• DOI: 10.1134/S1027451017050159

The refraction angles θ
d
of electron beams passing through aluminum and thin flat copper foils and reflection angles θ
r
are measured. A microtron with 7.4 MeV particles is used as a source of electrons. The angle between the particle trajectory and the target surface α is varied in the range 5°–30°. The dependences of the refraction and reflection angles on the α angle and foil thickness δ are measured. A dosimetric film is used to make pictures of cross sections of the electron beam scattered by a thin 50 μm copper foil. Image processing allows the spatial distributions of refracted and reflected particles to be obtained. The processes of relativistic electron scattering at a small angle of incidence on a flat target are simulated by the Monte Carlo method. The results of simulation are compared with experimental data. Particle scattering at a bimetallic target consisting of 200-μm aluminum and 70-μm lead layers are simulated. A dependence of the spatial-energy distributions on the order of metal layers placed along electron trajectories is found.