A Wide Vacuum Ultraviolet Range Spectrometer for Use with an Electron Beam Ion Trap

A Wide Vacuum Ultraviolet Range Spectrometer for Use with an Electron Beam Ion Trap

We present a new spectrometer for spectroscopic studies of highly charged ions with an electron beam ion trap (EBIT) in the vacuum ultraviolet range. The useful range of the spectrometer is as wide as 11–124 nm, which covers the range longer than 40 nm where few EBIT measurements have been performed...

Full description

Saved in:
Bibliographic Details
Published in:Journal of the Physical Society of Japan Vol. 90; no. 11; p. 1
Main Authors: Nakamura, Nobuyuki, Numadate, Naoki, Sakaue, Hiroyuki A.
Format: Journal Article
Language:English
Published: Tokyo The Physical Society of Japan 15-11-2021
Subjects:
Electron beams
Ions
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:We present a new spectrometer for spectroscopic studies of highly charged ions with an electron beam ion trap (EBIT) in the vacuum ultraviolet range. The useful range of the spectrometer is as wide as 11–124 nm, which covers the range longer than 40 nm where few EBIT measurements have been performed thus far. It is of a grazing incidence flat-field type with aberration-corrected concave gratings used in the slit-less configuration, where the narrow-line-shaped source in an EBIT is regarded as an entrance slit. The performance of the spectrometer studied with a compact EBIT is presented.
ISSN:0031-9015
1347-4073
DOI:10.7566/JPSJ.90.114301