Characterization of the creep exposed CMSX2 single crystal by neutron diffraction topography and neutron diffractometry

Characterization of the creep exposed CMSX2 single crystal by neutron diffraction topography and neutron diffractometry

The single crystal superalloy CMSX2 was studied after a creep exposition at high temperature by neutron diffraction topography and neutron diffractometry. Topographs clearly displayed the dendritic structure of the sample. The topographs and the rocking curves indicate an influence of the creep both...

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Bibliographic Details
Published in:Czechoslovak journal of physics Vol. 44; no. 7; pp. 687 - 693
Main Authors: Strunz, P., Lukáš, P., Mikula, P., Šaroun, J., Albertini, G., Rustichelli, F., Cicognani, G., Di Gianfrancesco, A.
Format: Journal Article
Language:English
Published: 01-07-1994
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Summary:The single crystal superalloy CMSX2 was studied after a creep exposition at high temperature by neutron diffraction topography and neutron diffractometry. Topographs clearly displayed the dendritic structure of the sample. The topographs and the rocking curves indicate an influence of the creep both on the dendritic structure of the sample and on the individual dendrites.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
ISSN:0011-4626
1572-9486
DOI:10.1007/BF01694839