Structure and C-V characteristics of PZ/PZT multilayer thin films (in PZ/PZT series sequences) prepared by sol-gel technique

Structure and C-V characteristics of PZ/PZT multilayer thin films (in PZ/PZT series sequences) prepared by sol-gel technique

Lead Zirconate (PbZrO 3 : PZ) and Lead Zirconium Titanate (PZT) multilayered thin films were prepared by sol-gel technique. Sets of films (each layer has a 450Å thickness) made by one PZ after one PZT layer are deposited 3 times successively. These films were annealed just one time after full deposi...

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Published in:Ferroelectrics Vol. 260; no. 1; pp. 131 - 136
Main Authors: Bae, Se-Hwan, Jeon, Kie-Beom, Kim, Sung-Chul, Jin, Byung-Moon
Format: Journal Article
Language:English
Published: Taylor & Francis Group 01-01-2001
Subjects:
lead zirconate
lead zirconate titanate
multi-layer
sol-gel
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Abstract Lead Zirconate (PbZrO 3 : PZ) and Lead Zirconium Titanate (PZT) multilayered thin films were prepared by sol-gel technique. Sets of films (each layer has a 450Å thickness) made by one PZ after one PZT layer are deposited 3 times successively. These films were annealed just one time after full deposition. Two another sets of films were prepared with the same sequences but different annealing conditions. The mixed phase of ferro- and anti-ferroelectric phases are existed in films that were annealed at every single deposition. A flat voltage response will be testified by measuring C-V characteristics for these two different films.
AbstractList Lead Zirconate (PbZrO 3 : PZ) and Lead Zirconium Titanate (PZT) multilayered thin films were prepared by sol-gel technique. Sets of films (each layer has a 450Å thickness) made by one PZ after one PZT layer are deposited 3 times successively. These films were annealed just one time after full deposition. Two another sets of films were prepared with the same sequences but different annealing conditions. The mixed phase of ferro- and anti-ferroelectric phases are existed in films that were annealed at every single deposition. A flat voltage response will be testified by measuring C-V characteristics for these two different films.
Author Jin, Byung-Moon
Jeon, Kie-Beom
Kim, Sung-Chul
Bae, Se-Hwan
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10.1143/JJAP.33.5265
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References Aaron B. Wegner (CIT0004) 1991; 116
Polla D. L. (CIT0003) 1992; 243
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Yuichi Nakao (CIT0001) 1994; 33
Bae S. H. (CIT0005) 2000; 35
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  publication-title: Mat. Res. Soc. Symp. Proc.
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  contributor:
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– volume: 116
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  doi: 10.1080/00150199108007942
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  doi: 10.1143/JJAP.33.5265
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Snippet Lead Zirconate (PbZrO 3 : PZ) and Lead Zirconium Titanate (PZT) multilayered thin films were prepared by sol-gel technique. Sets of films (each layer has a...
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SubjectTerms lead zirconate
lead zirconate titanate
multi-layer
sol-gel
Title Structure and C-V characteristics of PZ/PZT multilayer thin films (in PZ/PZT series sequences) prepared by sol-gel technique
URI https://www.tandfonline.com/doi/abs/10.1080/00150190108016006
Volume 260
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