General formula for optical characterization of multi-elliptical core optical fibers with microscopic interferometry

• Published in: International journal of polymeric materials Vol. 52; no. 9; pp. 761 - 772
• Main Author: Sadik, A. M.
• Format: Journal Article
• Language: English
• Published: Philadelphia, PA Taylor & Francis Group 01-01-2003; Taylor & Francis
• Subjects: Applied sciences; Circuit properties; Electric, optical and optoelectronic circuits; Electronics; Exact sciences and technology; Fiber testing and measurement of fiber parameters; Integrated optics. Optical fibers and wave guides; Mach-Zehnder Interferometer; Multi-elliptical Core; Optical and optoelectronic circuits; Optical Fiber; Refractive Index; Refractive Index Profile; Refractive index measurement; Optical interferometry; Mach-Zehnder interferometer; multi-elliptical core; refractive index profile; Mach Zehnder interferometer; Theoretical study; refractive index; Experimental study; Optical fiber
• ISSN: 0091-4037; 1563-535X
• DOI: 10.1080/713743714

In the present paper, the interference pattern of multi-elliptical core optical fiber in a transverse interferometer has been described by a general interference formula. This formula with Mach-Zehnder interferometry is used to characterize multi-elliptical core optical fiber via its refractive index measurement. Example of application to identical nine-elliptical core optical fiber of thickness 380 microns is given.