Self-heating of stressed VDMOS devices under specific operating conditions

Self-heating of stressed VDMOS devices under specific operating conditions

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Bibliographic Details
Published in:Microelectronics and reliability Vol. 150; p. 115213
Main Authors: Veljković, S., Mitrović, N., Jovanović, I., Živanović, E., Paskaleva, A., Spassov, D., Mančić, D., Danković, D.
Format: Journal Article
Language:English
Published: 01-11-2023
Online Access:Get full text
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Description
ISSN:0026-2714
DOI:10.1016/j.microrel.2023.115213