InGaAs/InGaAsP integrated tunable detector grown by chemical beam epitaxy

By controlling the thickness of the grating depth with chemical beam epitaxy (CBE) growth time, we report in this letter the design and performance of an integrated tunable detector. A carefully designed tunable active filter, which allows only one below threshold Fabry–Perot mode for operation, is...

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Bibliographic Details
Published in:Applied physics letters Vol. 63; no. 13; pp. 1836 - 1838
Main Authors: CHOA, F. S, TSANG, W. T, LOGAN, R. A, GNALL, R. P, KOCH, T. L, BURRUS, C. A, WU, M. C, CHEN, Y. K, KAPRE, R
Format: Journal Article
Language:English
Published: Melville, NY American Institute of Physics 27-09-1993
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Summary:By controlling the thickness of the grating depth with chemical beam epitaxy (CBE) growth time, we report in this letter the design and performance of an integrated tunable detector. A carefully designed tunable active filter, which allows only one below threshold Fabry–Perot mode for operation, is integrated with a waveguide detector. The full tuning range of this kind of tunable device can now be utilized for system applications.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.110678