Line shape and composition of the In 3d5/2 core-level photoemission for the interface analysis of In-containing III–V semiconductors
•Photoelectron study of the controversial In 3d line shape of III–V semiconductors.•The spectral envelope is found to be fit well by a combination of symmetric peaks.•The energy band gap has no effect on the spectral features of In 3d peak.•In 3d emissions are described well with reconstruction-indu...
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Published in: | Applied surface science Vol. 329; pp. 371 - 375 |
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Main Authors: | , , , , , , , , , , |
Format: | Journal Article |
Language: | English |
Published: |
Elsevier B.V
01-02-2015
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Subjects: | |
Online Access: | Get full text |
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Summary: | •Photoelectron study of the controversial In 3d line shape of III–V semiconductors.•The spectral envelope is found to be fit well by a combination of symmetric peaks.•The energy band gap has no effect on the spectral features of In 3d peak.•In 3d emissions are described well with reconstruction-induced core-level shifts.•The results are important to photoelectron studies of the III–V device materials.
The In 3d5/2 photoelectron spectroscopy peak has been widely used to determine the interface structures of In-containing III–V device materials (e.g., oxidation states). However, an unclear parameter affecting the determination of the energy shifts and number of the core-level components, and therefore, the interpreted interface structure and composition, is still the intrinsic In 3d5/2 peak line shape. It is undecided whether the line shape is naturally symmetric or asymmetric for pure In-containing III–V compounds. By using high-resolution photoelectron spectroscopy, we show that the In 3d5/2 asymmetry arising from the emission at high binding-energy tail is not an intrinsic property of InAs, InP, InSb and InGaAs. Furthermore, it is shown that asymmetry of In 3d5/2 peaks of pure III–V's originates from the natural surface reconstructions which cause the coexistence of slightly shifted In 3d5/2 components with the symmetric peak shape and dominant Lorentzian broadening. |
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Bibliography: | ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 23 |
ISSN: | 0169-4332 1873-5584 |
DOI: | 10.1016/j.apsusc.2014.12.155 |