Effect of annealing time on morphological characteristics of Ba(Zr,Ti)O3 thin films

• Published in: Journal of alloys and compounds Vol. 437; no. 1-2; pp. 269 - 273
• Main Authors: CAVALCANTE, L. S, ANICETE-SANTOS, M, PONTES, F. M, SOUZA, I. A, SANTOS, L. P. S, ROSA, I. L. V, SANTOS, M. R. M. C, SANTOS-JUNIOR, L. S, LEITE, E. R, LONGO, E
• Format: Journal Article
• Language: English
• Published: Lausanne Elsevier 01-06-2007
• Subjects: Condensed matter: structure, mechanical and thermal properties; Exact sciences and technology; Physics; Structure and morphology; thickness; Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties); Thin film structure and morphology; Atomic force microscopy; Scanning electron microscopy; Annealing; Barium Zirconates; Barium titanates; Perovskites; XRD; Infrared spectra; Thin films; Thickness; Vibrational modes; Fourier transform spectra; Microstructure; BZT; Annealing time
• ISSN: 0925-8388; 1873-4669
• DOI: 10.1016/j.jallcom.2006.07.100

Ba(Zr0.50 Ti0.50)O3 thin films were prepared by the polymeric precursor method using the annealing low temperature of 300 deg C for 8, 16, 24, 48, 96 and 192h in a furnace tube with oxygen atmosphere. The X-ray diffraction patterns revealed that the film annealed for 192h presented some crystallographic planes (100), (110) and (200) in its crystalline lattice. Fourier transformed infrared presented the formation of metal-oxygen stretching at around 756cm-1. The atomic force microscopy analysis presented the growth of granules in the Ba(Zr0.50 Ti0.50)O3 films annealed from 8 to 96h. The crystalline film annealed for 192h already presents grains in its perovskite structure. It evidenced a reduction in the thickness of the thin films with the increase of the annealing time.