Quantum dot quantum cascade photodetector using a laser structure

We report on a quantum dot quantum cascade detector(QD-QCD), whose structure is derived from a QD cascade laser. In this structure, more ordered In As QD layers formed in the Stranski-Krastanow growth mode on a thin Ga As buffer layer are incorporated into the active region. This QD-QCD can operate...

Full description

Saved in:
Bibliographic Details
Published in:Chinese optics letters Vol. 15; no. 10; pp. 85 - 89
Main Author: 王风娇;卓宁;刘舒曼;任飞;翟慎强;刘俊岐;张锦川;刘峰奇;王占国
Format: Journal Article
Language:English
Published: 10-10-2017
Subjects:
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:We report on a quantum dot quantum cascade detector(QD-QCD), whose structure is derived from a QD cascade laser. In this structure, more ordered In As QD layers formed in the Stranski-Krastanow growth mode on a thin Ga As buffer layer are incorporated into the active region. This QD-QCD can operate up to room temperature with a peak detection wavelength of 5.8 μm. A responsivity of 3.1 mA/W at 160 K and a detectivity of 3.6 × 10~8 Jones at 77 K are obtained. The initial performance of the detector is promising, and, by further optimizing the growth of InA s QDs, integrated QD-quantum cascade laser/QCD applications are expected.
Bibliography:We report on a quantum dot quantum cascade detector(QD-QCD), whose structure is derived from a QD cascade laser. In this structure, more ordered In As QD layers formed in the Stranski-Krastanow growth mode on a thin Ga As buffer layer are incorporated into the active region. This QD-QCD can operate up to room temperature with a peak detection wavelength of 5.8 μm. A responsivity of 3.1 mA/W at 160 K and a detectivity of 3.6 × 10~8 Jones at 77 K are obtained. The initial performance of the detector is promising, and, by further optimizing the growth of InA s QDs, integrated QD-quantum cascade laser/QCD applications are expected.
31-1890/O4
Fengjiao Wang 1, Ning Zhuo 1, Shuman Liu1,2, Fei Ren 1 Shenqiang Zhai 1, Junqi Liu 1,2, Jinchuan Zhang 1 , Fengqi Liu 1,2, and Zhanguo Wang (Key Laboratory of Semiconductor Materials Science, Institute of Semiconductors, Chinese Academy of Sciences, Beijing Key Laboratory of Low Dimensional Semiconductor Materials and Devices, Beijing 100083, China 2College of Materials Science and Opto-Electronic Technology, University of Chinese Academy of Sciences, Beijing 100049, China)
ISSN:1671-7694
DOI:10.3788/COL201715.102301