Graphene oxidation and reduction in medium vacuum by an UV lamp at 365 nm wavelength
The time-dependent graphene oxide (GO) reduction in medium vacuum under ultraviolet (UV) irradiation at 365 nm has been investigated. We found that GO exposed to UV at room temperature and at a vacuum of about 10 −1 mbar shows a notable oxidation for irradiation times up to about 60 min followed by...
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Published in: | Radiation effects and defects in solids Vol. 179; no. 9-10; pp. 1394 - 1408 |
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Main Authors: | , , , , , , |
Format: | Journal Article |
Language: | English |
Published: |
Abingdon
Taylor & Francis
02-09-2024
Taylor & Francis Ltd |
Subjects: | |
Online Access: | Get full text |
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Summary: | The time-dependent graphene oxide (GO) reduction in medium vacuum under ultraviolet (UV) irradiation at 365 nm has been investigated. We found that GO exposed to UV at room temperature and at a vacuum of about 10
−1
mbar shows a notable oxidation for irradiation times up to about 60 min followed by a successive reduction up to 210 min. Characterization measurements have been performed mainly using the Attenuated Total Reflectance (ATR) Fourier Transform Infrared (FTIR) and Raman spectroscopies. ATR-FTIR spectra, acquired in the (400-4000) cm
−1
wavenumber range, have indicated an initial decrement of the IR transmission (oxidation process) with the exposure time up to about 60 min and a successive increase of the IR transmission (reduction process) for greater irradiation times up to 210 min. The IR transmission bands are attributed to the oxygen functional groups contained in GO which increase for low UV exposure times and gradually disappear during the UV-induced reduction process. Raman spectra confirm this interpretation showing a decrease of the A
D
/A
G
ratio value, with respect to the GO virgin value, for low UV exposure times and an increase for greater times. The GO oxidation and reduction processes, due to the UV GO treatment in medium vacuum conditions, have been also verified by energy dispersive X-ray fluorescence and surface wettability measurements. |
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ISSN: | 1042-0150 1029-4953 |
DOI: | 10.1080/10420150.2024.2346321 |