Structural characterization and optical properties of UO2 thin films by magnetron sputtering

Structural characterization and optical properties of UO2 thin films by magnetron sputtering

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Bibliographic Details
Published in:Applied surface science Vol. 256; no. 10; pp. 3047 - 3050
Main Authors: Chen, Qiuyun, Lai, Xinchun, Bai, Bin, Chu, Mingfu
Format: Journal Article
Language:English
Published: Amsterdam Elsevier 01-03-2010
Subjects:
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Condensed matter: structure, mechanical and thermal properties
Cross-disciplinary physics: materials science; rheology
Exact sciences and technology
Physics
Atomic force microscopy
AFM
XRD
Film growth
Ellipsometry
Thin films
Magnetrons
Cathode sputtering
Actinides
Uranium
XPS
Uranium dioxide
X-ray photoelectron spectra
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Description
ISSN:0169-4332
1873-5584
DOI:10.1016/j.apsusc.2009.11.071