Application of Stochastic FDTD to Holland's Thin-Wire Method

• Published in: IEEE antennas and wireless propagation letters Vol. 18; no. 10; pp. 2046 - 2050
• Main Authors: Garcia, Salvador Gonzalez, Cabello, Miguel R., Angulo, Luis D., Bretones, A. Rubio, Atienza, Myriam G., Pascual-Gil, E.
• Format: Journal Article
• Language: English
• Published: New York IEEE 01-10-2019; The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
• Subjects: Correlation; Cross correlation; Dipole antennas; Finite difference methods; Finite difference time domain method; Finite-difference time domain (FDTD); Monte Carlo simulation; Monte Carlo method; stochastic methods; Stochastic processes; thin-wire model; Time domain analysis; Uncertainty; Wires; Wu–King antenna
• ISSN: 1536-1225; 1548-5757
• DOI: 10.1109/LAWP.2019.2937184

This letter presents an extension of the stochastic finite-difference time-domain (FDTD) method to predict the standard deviation of currents and charges in the Holland FDTD subcell method for thin wires. A discussion is presented on the effect of cross correlation between the variables affected by uncertainty and the variability of the observed quantities. For this, a simple dipole antenna loaded with a Wu-King profile is analyzed, and the results are validated with the Monte Carlo method.