Comment on analysis of X-ray diffraction data in the paper “Structural and size dependence magnetic properties of Mn-doped NiO nanoparticles prepared by wet chemical method" by C. Thangamani et al. [J. Mater. Sci: Mater. Electron. 31, 11101 (2020)]

Comment on analysis of X-ray diffraction data in the paper “Structural and size dependence magnetic properties of Mn-doped NiO nanoparticles prepared by wet chemical method" by C. Thangamani et al. [J. Mater. Sci: Mater. Electron. 31, 11101 (2020)]

In the commented paper, there are some questionable data which should be explained or corrected by the Authors, Thangamani et al. In this comment, I have tried to pinpoint incorrect data or inconsistencies and to verify the correctness of the data presented in the crystallographic part of the paper.

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Bibliographic Details
Published in:Journal of materials science. Materials in electronics Vol. 32; no. 8; pp. 9731 - 9735
Main Author: Tomaszewski, Paweł E.
Format: Journal Article
Language:English
Published: New York Springer US 01-04-2021
Springer Nature B.V
Subjects:
Characterization and Evaluation of Materials
Chemistry and Materials Science
Comments
Crystallography
Magnetic properties
Materials Science
Nanoparticles
Optical and Electronic Materials
Online Access:Get full text
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Description
Summary:In the commented paper, there are some questionable data which should be explained or corrected by the Authors, Thangamani et al. In this comment, I have tried to pinpoint incorrect data or inconsistencies and to verify the correctness of the data presented in the crystallographic part of the paper.
ISSN:0957-4522
1573-482X
DOI:10.1007/s10854-021-05680-5