Morphology and conjugation of nanocrystals growing in Cr-O and V-O amorphous films during annealing

• Published in: Russian physics journal Vol. 50; no. 11; pp. 1071 - 1078
• Main Authors: Bagmut, A. G., Grigorov, S. N., Zhuchkov, V. A., Kolosov, V. Yu, Kosevich, V. M., Mel’nichenko, D. V.
• Format: Journal Article
• Language: English
• Published: New York Springer Nature B.V 01-11-2007
• Subjects: Annealing; Conjugation; Crystal structure; Crystallization; Electron beams; Electron diffraction; Electrons; Impurities; Impurity effects; Morphology; Nanocrystals; Thickness; Vanadium oxides
• ISSN: 1064-8887; 1573-9228
• DOI: 10.1007/s11182-007-0157-6

Methods of transmission electron microscopy and electron diffraction are used to determine the main morphological types of Cr2O3 and V2O3 nanocrystals as well as their evolution in the process of growth in crystallizing amorphous laser condensates during annealing. Films are deposited from laser erosion plasma by sputtering of Cr and V targets in an oxygen atmosphere. Annealing is carried out with an electron beam in the microscope column. Orientational relations are established for conjugation of crystals of various morphological types. The crystallization process in amorphous films with a thickness gradient is investigated. The impurity and size-impurity effects of amorphous state stabilization are revealed.