Low-Z FIB Grids for Reducing Spurious Fluorescence and X-ray Overlaps

• Published in: Microscopy today Vol. 30; no. 2; pp. 24 - 29
• Main Authors: Giannuzzi, Lucille A., Moldovan, Nicolaie, Trindell, Jamie A., Sugar, Joshua D.
• Format: Magazine Article
• Language: English
• Published: New York, USA Cambridge University Press 01-03-2022; Oxford University Press
• Subjects: Diamonds; EDS; Energy; FIB; Fluorescence; High temperature; low-Z grid; OTHER INSTRUMENTATION; Scanning electron microscopy; SEM; STEM; Techniques and Equipment Development; Thin films; X-rays; SEM; EDS; low-Z grid; FIB; STEM
• ISSN: 1551-9295; 2150-3583
• DOI: 10.1017/S1551929522000414

Low-Z nanocrystalline diamond (NCD) grids have been developed to reduce spurious fluorescence and avoid X-ray peak overlaps or interferences between the specimen and conventional metal grids. The low-Z NCD grids are non-toxic and safe to handle, conductive, can be subjected to high-temperature heating experiments, and may be used for analytical work in lieu of metal grids. Both a half-grid geometry, which can be used for any lift-out method, or a full-grid geometry that can be used for ex situ lift-out or thin film analyses, can be fabricated and used for experiments.