Intrinsic Josephson junction characteristics of Nd2-xCexCuO4 /SrTiO3 epitaxial films

• Published in: Solid state communications Vol. 394; p. 115723
• Main Authors: Charikova, T.B., Devyaterikov, D.I., Neverov, V.N., Popov, M.R., Shelushinina, N.G., Ivanov, A.A.
• Format: Journal Article
• Language: English
• Published: Elsevier Ltd 15-12-2024
• Subjects: Current-voltage characteristics; Electron-doped cuprate superconductors; Epitaxial films; Intrinsic josephson junctions; Current-voltage characteristics; Epitaxial films; Intrinsic josephson junctions; Electron-doped cuprate superconductors
• ISSN: 0038-1098
• DOI: 10.1016/j.ssc.2024.115723

The current-voltage (I-V) properties along the c axis on Nd2-xCexCuO4/SrTiO3 epitaxial films with x = 0.145, 0.15 were investigated. For all the samples it has been established that the I-V characteristics exhibit several resistive branches, which correspond to the resistive states of individual Josephson junctions. The results confirm the idea of a tunneling mechanism between the CuO2 layers (superconductor - insulator - superconductor junction) for the investigated Nd2-xCexCuO4 compound. The I-V dependence of this compound with x = 0.15 points out on the nonmonotonic nature of the d-wave or anisotropic s-wave symmetry order parameter associated with the coexistence of superconductivity and antiferromagnetic fluctuations.
•Electron doped superconducting Nd2-xCexCuO4/SrTiO3 epitaxial films with x = 0.145, 0.15.•The I-V characteristics exhibit several resistive branches, which correspond to the resistive states of individual Josephson junctions.•The I-V dependence points out on the nonmonotonic character of the d-wave order parameter.