Thin films: stress, strain and structure–property relations

Thin films: stress, strain and structure–property relations

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Bibliographic Details
Published in:Thin solid films Vol. 424; no. 1; p. 1
Main Authors: Yeadon, Mark, Kaiyang, Zeng, Huey Hoon, Hng, Twesten, Ray D, Abothu, Robin
Format: Journal Article
Language:English
Published: Elsevier B.V 2003
Online Access:Get full text
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Description
ISSN:0040-6090
1879-2731
DOI:10.1016/S0040-6090(02)00899-4