Reliability model for dual constant-stress accelerated life test with Weibull distribution under Type-I censoring scheme

Reliability model for dual constant-stress accelerated life test with Weibull distribution under Type-I censoring scheme

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Bibliographic Details
Published in:Communications in statistics. Theory and methods Vol. 51; no. 24; pp. 8579 - 8597
Main Authors: Feng, Xuefeng, Tang, Jiayin, Tan, Qitao, Yin, Zekai
Format: Journal Article
Language:English
Published: 17-12-2022
Online Access:Get full text
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Description
ISSN:0361-0926
1532-415X
DOI:10.1080/03610926.2021.1900868