3aA_MI-8A comparative study of patch-based noise reduction methods for atomic-resolution XEDS maps

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Bibliographic Details
Published in:	Microscopy Vol. 67; no. suppl_2; p. i28
Main Authors:	Yamamoto, Tomokazu, Yang, Wenhui, Aso, Kohei, Yasuda, Kazuhiro, Matsumura, Syo
Format:	Journal Article
Language:	English
Published:	Oxford University Press 01-11-2018
Online Access:	Get full text
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ISSN:	2050-5698 2050-5701
DOI:	10.1093/jmicro/dfy082