Multiple Cell Upset Cross-Section Uncertainty in Nanoscale Memories: Microdosimetric Approach

Multiple Cell Upset Cross-Section Uncertainty in Nanoscale Memories: Microdosimetric Approach

We found that the energy deposition fluctuations in the sensitive volumes may cause multiplicity scatters in the multiple cell upsets in the nanoscale (with feature sizes less than 100 nm) memories.

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Bibliographic Details
Main Authors: Zebrev, G. I, Zemtsov, K. S, Useinov, R. G, Gorbunov, M. S, Emeliyanov, V. V, Ozerov, A. I
Format: Journal Article
Language:English
Published: 17-04-2015
Subjects:
Physics - Accelerator Physics
Physics - Mesoscale and Nanoscale Physics
Physics - Space Physics
Online Access:Get full text
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Description
Summary:We found that the energy deposition fluctuations in the sensitive volumes may cause multiplicity scatters in the multiple cell upsets in the nanoscale (with feature sizes less than 100 nm) memories.
DOI:10.48550/arxiv.1504.04519