Fabrication of Scanning Electrochemical Microscopy-Atomic Force Microscopy Probes to Image Surface Topography and Reactivity at the Nanoscale

• Published in: Analytical chemistry (Washington) Vol. 89; no. 5; pp. 2687 - 2691
• Main Authors: Velmurugan, Jeyavel, Agrawal, Amit, An, Sangmin, Choudhary, Eric, Szalai, Veronika A
• Format: Journal Article
• Language: English
• Published: United States American Chemical Society 07-03-2017
• Subjects: Analytical chemistry; Atomic force microscopy; Catalysts; Chemical products; Chemical reactions; Cracks; Mapping; Microscopy; Nanoscience; Nanostructure; Scanning; Surface chemistry; Tuning
• ISSN: 0003-2700; 1520-6882
• DOI: 10.1021/acs.analchem.7b00210

Concurrent mapping of chemical reactivity and morphology of heterogeneous electrocatalysts at the nanoscale allows identification of active areas (protrusions, flat film surface, or cracks) responsible for productive chemistry in these materials. Scanning electrochemical microscopy (SECM) can map surface characteristics, record catalyst activity, and identify chemical products at solid–liquid electrochemical interfaces. It lacks, however, the ability to distinguish topographic features where surface reactivity occurs. Here, we report the design and fabrication of scanning probe tips that combine SECM with atomic force microscopy (AFM) to perform measurements at the nanoscale. Our probes are fabricated by integrating nanoelectrodes with quartz tuning forks (QTFs). Using a calibration standard fabricated in our lab to test our probes, we obtain simultaneous topographic and electrochemical reactivity maps with a lateral resolution of 150 nm.