Local Whole-Device Scanning of Distortion in Superconducting Microwave Resonators

• Main Authors: Remillard, S. K, Wormmeester, A. E, Huizen, R. A
• Format: Journal Article
• Language: English
• Published: 29-01-2018
• Subjects: Physics - Superconductivity
• DOI: 10.48550/arxiv.1709.03025

Using a near-field microwave technique, two-dimensional images have been made
of the second and third order intermodulation distortion (IMD) of Tl2Ba2CaCu2O8
and YBa2Cu3O7 thin film microwave resonators. It was found that second and
third order IMD do not have identical spatial distributions, which indicates
that physical mechanisms play different roles in their generation. This
technique enables the investigation of the roles of these mechanisms. As an
illustration, the sensitivity to magnetic fluxons of the two orders is
described, with second order being more sensitive to fluxon density.