The electronic structure formation of CuxTiSe2 in a wide range (0.04 < x < 0.8) of copper concentration

• Main Authors: Shkvarin, A. S, Yarmoshenko, Yu. M, Yablonskikh, M. V, Merentsov, A. I, Shkvarina, E. G, Titov, A. A, Titov, A. N
• Format: Journal Article
• Language: English
• Published: 10-09-2015
• Subjects: Physics - Materials Science
• DOI: 10.48550/arxiv.1509.03102

An experimental study of the electronic structure of copper intercalated
titanium dichalcogenides in a wide range of copper concentrations (x = 0.05 -
0.6) using the x-rays photoemission spectroscopy, resonant photoemission and
x-rays absorption spectroscopy has been performed. Negative energy shifts of
the Ti 2p and Se 3d core levels spectra and a corresponding decrease of the
photon energy in Ti 2p absorption spectra with increasing concentration of
copper have been found. Such sign-anomalous shifts may be explained by the
shielding effect of the corresponding atomic shells as a result of the dynamic
charge transfer during the formation of a covalent chemical bond between the
copper atoms and the TiSe2 matrix.