MxTiSe2 (M = Cr, Mn, Cu) electronic structure study by methods of resonant X-ray photoemission spectroscopy and X-Ray absorption spectroscopy

MxTiSe2 (M = Cr, Mn, Cu) electronic structure study by methods of resonant X-ray photoemission spectroscopy and X-Ray absorption spectroscopy

Electronic structure and chemical bonding in TiX2 (X=S, Se, Te), TMxTiSe2 (TM=Cr, Mn, Cu) and CrxTi1-xSe2 were studied by x-ray resonance photoemission and absorption spectroscopy. These methods are detected to be strong sensitive to chemical bonding. Charge transfer from the intercalated atoms to T...

Full description

Saved in:
Bibliographic Details
Main Authors: Shkvarin, A. S, Yarmoshenko, Yu. M, Yablonskikh, M. V, Skorikov, N. A, Merentsov, A. I, Titov, A. N
Format: Journal Article
Language:English
Published: 09-06-2011
Subjects:
Physics - Other Condensed Matter
Physics - Strongly Correlated Electrons
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:Electronic structure and chemical bonding in TiX2 (X=S, Se, Te), TMxTiSe2 (TM=Cr, Mn, Cu) and CrxTi1-xSe2 were studied by x-ray resonance photoemission and absorption spectroscopy. These methods are detected to be strong sensitive to chemical bonding. Charge transfer from the intercalated atoms to Ti 3d band is detected. Narrow Ti 3d and Cu 3d bands are observed under Fermi level in CuxTiSe2.
DOI:10.48550/arxiv.1106.1737