X-ray Spectrometry

Szaloki, Osan and Van Grieken outline the newest developments and improvements in the main fields of X-ray spectrometry, published in the period 2002-2003: algorithms for spectral evaluation and data processing methods, detectors, excitation devices, optical instruments, quantitative models for X-ra...

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Bibliographic Details
Published in:	Analytical chemistry (Washington) Vol. 76; no. 12; pp. 3445 - 3470
Main Authors:	Szalóki, Imre, Osán, János, Van Grieken, René E
Format:	Journal Article
Language:	English
Published:	Washington, DC American Chemical Society 15-06-2004
Subjects:	Analytical chemistry Chemistry Electron Probe Microanalysis - methods Exact sciences and technology Fluorescence Holography - methods Scientific imaging Spectrometric and optical methods Spectrum Analysis - instrumentation Spectrum Analysis - methods Tomography - methods X-Rays Holography X ray spectrometry Tomography X ray fluorescence spectrometry Electron probe analysis Review Total reflection
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Summary:	Szaloki, Osan and Van Grieken outline the newest developments and improvements in the main fields of X-ray spectrometry, published in the period 2002-2003: algorithms for spectral evaluation and data processing methods, detectors, excitation devices, optical instruments, quantitative models for X-ray fluorescence analysis and electron probe microanalysis, holography and XRF tomography methods, absorption spectrometry, and applications in each analytical subfield.
Bibliography:	istex:88BA83D78BF1546CD78F8C5E352E7A048FC6D360 ark:/67375/TPS-SCRH3S2P-1 ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-3 content type line 23 ObjectType-Review-1
ISSN:	0003-2700 1520-6882
DOI:	10.1021/ac0400820