Effect of Aluminum on the Local Structure of Silicon in Zeolites as Studied by Si K Edge X-ray Absorption Near-Edge Fine Structure: Spectra Simulation with a Non-Muffin Tin Atomic Background

• Published in: The journal of physical chemistry. B Vol. 113; no. 14; pp. 4614 - 4618
• Main Authors: Bugaev, Lusegen A., Bokhoven, Jeroen A. van, Khrapko, Valerii V.
• Format: Journal Article
• Language: English
• Published: United States American Chemical Society 09-04-2009
• Subjects: Aluminum - chemistry; B: Macromolecules, Soft Matter; Molecular Structure; Silicon - chemistry; Spectrometry, X-Ray Emission - methods; Zeolites - chemistry
• ISSN: 1520-6106; 1520-5207
• DOI: 10.1021/jp8098285

Experimental Si K edge X-ray absorption near-edge fine structure (XANES) of zeolite faujasite, mordenite, and beta are interpreted by means of the FEFF8 code, replacing the theoretical atomic background μ0 by a background that was extracted from an experimental spectrum. To some extent, this diminished the effect of the inaccuracy introduced by the MT potential and accounted for the intrinsic loss of photoelectrons. The agreement of the theoretical and experimental spectra at energies above the white lines enabled us to identify structural distortion around silicon, which occurs with increasing aluminum content. The Si K edge XANES spectra are very sensitive to slight distortions in the silicon coordination. Placing an aluminum atom on a nearest neighboring T site causes a distortion in the silicon tetrahedron, shortening one of the silicon−oxygen bonds relative to the other three.