High-Throughput Identification of Single Nanoparticles via Electrochemically Assisted High-Resolution Plasmonic Scattering Interferometric Microscopy

• Published in: Nano letters Vol. 24; no. 20; pp. 6124 - 6130
• Main Authors: Wu, Gang, Lv, Wen-Li, Qian, Chen, Liu, Xian-Wei
• Format: Journal Article
• Language: English
• Published: United States American Chemical Society 22-05-2024
• Subjects: electrochemical; nanoparticles; plasmonic imaging; interferometry; high resolution
• ISSN: 1530-6984; 1530-6992
• DOI: 10.1021/acs.nanolett.4c01334

The identification of nanoparticles within heterogeneous mixtures poses significant challenges due to the similarity in physical properties among different nanomaterials. Here, we present electrochemically assisted high-resolution plasmonic scattering interferometric microscopy (HR-PSIM). This technique allows for the high-throughput identification of nanoparticles by accurately measuring the refractive index of individual nanoparticles without interference from background signals. Through elimination of parabolic scattering interference and employing electrochemical modulation, HR-PSIM demonstrates high spatial resolution and stability against background noise, enabling the differentiation of nanoparticles with closely matched refractive indices, such as Au and Ag nanoparticles. The efficacy of this method is demonstrated through its application in real-time, label-free imaging of nanoparticle electrochemical activity, providing a platform for the precise and high-throughput characterization of nanomaterials. The robustness of our approach against electrochemical interference and its high spatial resolution mark a significant advancement in the field of nanomaterial analysis, promising wide-ranging applications in nanoparticle research and beyond.