Detection of Au+ Ions During Fluorine Gas-Assisted Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) for the Complete Elemental Characterization of Microbatteries

• Published in: ACS applied materials & interfaces Vol. 13; no. 34; pp. 41262 - 41274
• Main Authors: Priebe, Agnieszka, Sastre, Jordi, Futscher, Moritz H, Jurczyk, Jakub, Puydinger dos Santos, Marcos V, Romanyuk, Yaroslav E, Michler, Johann
• Format: Journal Article
• Language: English
• Published: American Chemical Society 01-09-2021
• Subjects: Surfaces, Interfaces, and Applications; Au; microdevices; mass spectrometry; ions; elemental characterization; Li-ion batteries; fluorine gas
• ISSN: 1944-8244; 1944-8252
• DOI: 10.1021/acsami.1c10352

Due to excellent electric conductivity and chemical inertness, Au can be used in new microdevices for energy applications, microelectronics, and biomedical solutions. However, the chemical analysis of Au-containing systems using time-of-flight secondary ion mass spectrometry (TOF-SIMS) can be difficult because of the negative ionization of Au, as most metals form positive ions, and therefore cannot be detected from the same analytical volume. In this work, we present the potential of fluorine gas coinjection for altering the polarity, from the negative to positive, of Au secondary ions generated under Ga+ beam bombardment. The importance of detecting Au+ ions and representing their spatial distribution in nanoscale was demonstrated using a novel solid electrolyte for Li-ion solid-state batteries, amorphous Li7La3Zr2O12 (aLLZO). This allowed for assessing the migration of mobile Li+ ions outside the aLLZO layer and alloying the Au layer with Li, which explained the presence of an internal electric field observed during the polarization measurements. Remarkably, during fluorine gas-assisted TOF-SIMS measurements, the trace amount of Au content (5 ppm) was detected in a Pt layer (unattainable under standard vacuum conditions). In conclusion, fluorine gas-assisted TOF-SIMS can help understanding operation mechanisms and potential degradation processes of microdevices and therefore help optimizing their functionality.