Insight into Facile Ion Diffusion in Resistive Switching Medium toward Low Operating Voltage Memory

• Published in: Nano letters Vol. 24; no. 26; pp. 7999 - 8007
• Main Authors: Do, Dinh Phuc, Bui, Viet Q., Nguyen, Minh Chien, Seo, Sohyeon, Do, Van Dam, Kim, Joosung, Choi, Jungsue, Ko, Hyun, Yu, Woo Jong, Kawazoe, Yoshiyuki, Lee, Hyoyoung
• Format: Journal Article
• Language: English
• Published: United States American Chemical Society 03-07-2024
• Subjects: high ON/OFF ratio; Graphdiyne; low operating voltage; graphdiyne oxide; memristor
• ISSN: 1530-6984; 1530-6992; 1530-6992
• DOI: 10.1021/acs.nanolett.4c01629

The rapid increase in data storage worldwide demands a substantial amount of energy consumption annually. Studies looking at low power consumption accompanied by high-performance memory are essential for next-generation memory. Here, Graphdiyne oxide (GDYO), characterized by facile resistive switching behavior, is systematically reported toward a low switching voltage memristor. The intrinsic large, homogeneous pore-size structure in GDYO facilitates ion diffusion processes, effectively suppressing the operating voltage. The theoretical approach highlights the remarkably low diffusion energy of the Ag ion (0.11 eV) and oxygen functional group (0.6 eV) within three layers of GDYO. The Ag/GDYO/Au memristor exhibits an ultralow operating voltage of 0.25 V with a GDYO thickness of 5 nm; meanwhile, the thicker GDYO of 29 nm presents multilevel memory with an ON/OFF ratio of up to 104. The findings shed light on memory resistive switching behavior, facilitating future improvements in GDYO-based devices toward opto-memristors, artificial synapses, and neuromorphic applications.