Far infrared study of some rare earth impurities in crystals of Pb(1-x)Sn(x)alloys
Single crystal samples of Pb(0.9)Sn(0.1)Te doped with Yb, Sm or Gd were produced using the Bridgman method. Far infrared reflectivity spectra were measured at room temperature for highly polished samples with various impurity concentration (between 0.2 at% and 1 at %). The experimental diagrams were...
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Published in: | Journal of Optoelectronics and Advanced Materials Vol. 11; no. 4; pp. 457 - 460 |
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Main Authors: | , , , , , , , |
Format: | Journal Article |
Language: | English |
Published: |
01-04-2009
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Online Access: | Get full text |
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