Thin-Film Microsusceptometer With Integrated Nanoloop : 2013 INTERNATIONAL SUPERCONDUCTIVE ELECTRONICS CONFERENCE (ISEC)

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Bibliographic Details
Published in:	IEEE transactions on applied superconductivity Vol. 24; no. 4
Main Authors:	DRUNG, Dietmar, STORM, Jan-Hendrik, RUEDE, Frank, KIRSTE, Alexander, REGIN, Marcel, SCHURIG, Thomas, REPOLLES, Ana M, SESE, Javier, LUIS, Fernando
Format:	Journal Article
Language:	English
Published:	New York, NY Institute of Electrical and Electronics Engineers 2014
Subjects:	Applied sciences Electronics Exact sciences and technology Microelectronic fabrication (materials and surfaces technology) Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Superconducting devices Performance evaluation Focused ion beam (FIB) Josephson junction Transfer coefficient Focused ion beam technology Optimal design Thin film Magnetic measurement Inductance superconducting quantum interference device (SQUID) Microelectronic fabrication Sensitivity Permalloy Line width First order Superconducting quantum interferometer device nanoloop microsusceptometer Magnetic field Signal detection
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ISSN:	1051-8223 1558-2515