Explanation of threshold voltage scaling in enhancement-mode InAIN/AIN-GaN metal oxide semiconductor high electron mobility transistors on Si substrates
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Published in: | Thin solid films Vol. 520; no. 19; pp. 6230 - 6232 |
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Main Authors: | , , , , , , , , , |
Format: | Journal Article |
Language: | English |
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Amsterdam
Elsevier
2012
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Author | BETHGE, O ALEXEWICZ, A CARLIN, J.-F POGANY, D OSTERMAIER, C STRASSER, G LUGANI, L BERTAGNOLLI, E HENKEL, C GRANDJEAN, N |
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Author_xml | – sequence: 1 givenname: A surname: ALEXEWICZ fullname: ALEXEWICZ, A organization: Vienna University of Technology, Floragasse 7, 1040 Vienna, Austria – sequence: 2 givenname: C surname: OSTERMAIER fullname: OSTERMAIER, C organization: Vienna University of Technology, Floragasse 7, 1040 Vienna, Austria – sequence: 3 givenname: C surname: HENKEL fullname: HENKEL, C organization: Vienna University of Technology, Floragasse 7, 1040 Vienna, Austria – sequence: 4 givenname: O surname: BETHGE fullname: BETHGE, O organization: Vienna University of Technology, Floragasse 7, 1040 Vienna, Austria – sequence: 5 givenname: J.-F surname: CARLIN fullname: CARLIN, J.-F organization: Eole Polytechnique Fédérate de Lausanne, Station 3, 1015 Lausanne, Switzerland – sequence: 6 givenname: L surname: LUGANI fullname: LUGANI, L organization: Eole Polytechnique Fédérate de Lausanne, Station 3, 1015 Lausanne, Switzerland – sequence: 7 givenname: N surname: GRANDJEAN fullname: GRANDJEAN, N organization: Eole Polytechnique Fédérate de Lausanne, Station 3, 1015 Lausanne, Switzerland – sequence: 8 givenname: E surname: BERTAGNOLLI fullname: BERTAGNOLLI, E organization: Vienna University of Technology, Floragasse 7, 1040 Vienna, Austria – sequence: 9 givenname: D surname: POGANY fullname: POGANY, D organization: Vienna University of Technology, Floragasse 7, 1040 Vienna, Austria – sequence: 10 givenname: G surname: STRASSER fullname: STRASSER, G organization: Vienna University of Technology, Floragasse 7, 1040 Vienna, Austria |
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Keywords | Voltage threshold Interlayers High electron mobility transistor (HEMT) Aluminium nitride InAIN/GaN heterostructure Normally-off Leakage currents Gallium nitride III-V compound Interfaces Zirconium oxide Gate oxide Gallium tellurides Scaling laws Drain current Logic gates Enhancement-mode (E-mode) High electron mobility transistors Gates Heterostructures III-V semiconductors |
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SubjectTerms | Applied sciences Cross-disciplinary physics: materials science; rheology Electronics Exact sciences and technology Materials science Other semiconductors Physics Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Specific materials Transistors |
Title | Explanation of threshold voltage scaling in enhancement-mode InAIN/AIN-GaN metal oxide semiconductor high electron mobility transistors on Si substrates |
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