Improving solar grade silicon by controlling extended defect generation and foreign atom defect interactions : Polycrystalline Semiconductors
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Published in: | Applied physics. A, Materials science & processing Vol. 96; no. 1; pp. 207 - 220 |
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Main Authors: | , , , |
Format: | Journal Article |
Language: | English |
Published: |
Heidelberg
Springer
2009
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Author | WÜRZNER, S SCHOLZ, S MÖLLER, H. J KADEN, T |
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Author_xml | – sequence: 1 givenname: H. J surname: MÖLLER fullname: MÖLLER, H. J organization: Institute for Experimental Physics, Technische Universität Bergakademie Freiberg, Leipziger Str. 23, 09599 Freiberg, Germany – sequence: 2 givenname: T surname: KADEN fullname: KADEN, T organization: Institute for Experimental Physics, Technische Universität Bergakademie Freiberg, Leipziger Str. 23, 09599 Freiberg, Germany – sequence: 3 givenname: S surname: SCHOLZ fullname: SCHOLZ, S organization: Institute for Experimental Physics, Technische Universität Bergakademie Freiberg, Leipziger Str. 23, 09599 Freiberg, Germany – sequence: 4 givenname: S surname: WÜRZNER fullname: WÜRZNER, S organization: Institute for Experimental Physics, Technische Universität Bergakademie Freiberg, Leipziger Str. 23, 09599 Freiberg, Germany |
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Keywords | Solar cell Impurity Crystal defect interaction Polycrystal Defect recombination Silicon Crystal defect Extended defect Contamination Defect formation Crystal growth from melts |
Language | English |
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SubjectTerms | Applied sciences Condensed matter: structure, mechanical and thermal properties Cross-disciplinary physics: materials science; rheology Defects and impurities in crystals; microstructure Energy Exact sciences and technology Growth from melts; zone melting and refining Materials science Methods of crystal growth; physics of crystal growth Natural energy Photovoltaic conversion Physics Solar cells. Photoelectrochemical cells Solar energy Stacking faults and other planar or extended defects Structure of solids and liquids; crystallography |
Title | Improving solar grade silicon by controlling extended defect generation and foreign atom defect interactions : Polycrystalline Semiconductors |
Volume | 96 |
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