Dynamic force microscopy and Kelvin probe force microscopy of KBr film on InSb(0 0 1) surface at submonolayer coverage

• Published in: Surface science Vol. 566-68; pp. 63 - 67
• Main Authors: KROK, F, KOLODZIEJ, J. J, SUCH, B, CZUBA, P, STRUSKI, P, PIATKOWSKI, P, SZYMONSKI, M
• Format: Conference Proceeding
• Language: English
• Published: Amsterdam Elsevier Science 2004; New York, NY; Lausanne
• Subjects: Condensed matter: electronic structure, electrical, magnetic, and optical properties; Condensed matter: structure, mechanical and thermal properties; Cross-disciplinary physics: materials science; rheology; Exact sciences and technology; Physics; Atomic force microscopy; Work functions; Inorganic compounds; Indium antimonides; Epitaxy; Roughness; Step; Coverage rate; Surface states; Surface structure; Imaging; Force microscopy; Island structure; and topography; Surface potential; Potassium bromides; Semiconductor materials; morphology; Kelvin probe; Surface topography; Film growth; Surface electronic phenomena (work function; Anisotropy; etc.); Indium antimonide; Alkali halides; Growth; Surface structure; Ultrahigh vacuum; Electrostatic potential; Spatial resolution; Non contact measurement
• ISSN: 0039-6028; 1879-2758