C-DIC: a new microscopy method for rational study of phase structures in incident light arrangement

C-DIC: a new microscopy method for rational study of phase structures in incident light arrangement

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Bibliographic Details
Published in:Thin solid films Vol. 462-63; pp. 257 - 262
Main Authors: DANZ, Rainer, GRETSCHER, Peter
Format: Conference Proceeding
Language:English
Published: Lausanne Elsevier Science 2004
Subjects:
Exact sciences and technology
Fundamental areas of phenomenology (including applications)
Interference
Optics
Physics
Wave optics
Optical microscopy
Differential interference contrast
Differential interferometry
Oscillations
Circular polarized light
Experimental study
Azimuth effect
Polarized light
Online Access:Get full text
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Description
ISSN:0040-6090
1879-2731