Soft X-Ray Resonant Magnetic Reflectivity Study of Thin Films and Multilayers

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Bibliographic Details
Published in:	7th Joint MMM-Intermag Conference. Abstracts (Cat. No.98CH36275) p. 27
Main Author:	Tonnerre, J.M.
Format:	Conference Proceeding
Language:	English
Published:	IEEE 1998
Subjects:	Iron Magnetic analysis Magnetic field induced strain Magnetic films Magnetic moments Magnetic multilayers Magnetic resonance Optical films Reflectivity Soft magnetic materials
Online Access:	Get full text
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Description
ISBN:	0780351185 9780780351189
DOI:	10.1109/INTMAG.1998.735518