Investigation of temperature and frequency dependences of dielectric characteristics of bulk dielectrics and semiconductors

Investigation of some dielectric and semiconductor materials in the millimeter waveband and temperature range from helium to room temperature is carried out. The technique using the open disk resonator with whispering gallery modes was used. The character of the behavior of permittivity and loss tan...

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Published in:2011 21st International Crimean Conference "Microwave & Telecommunication Technology" pp. 922 - 923
Main Authors: Golovashchenko, R. V., Goroshko, O. V., Derkach, V. N., Korzh, V. G., Tarapov, S. I.
Format: Conference Proceeding
Language:English
Published: IEEE 01-09-2011
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Abstract Investigation of some dielectric and semiconductor materials in the millimeter waveband and temperature range from helium to room temperature is carried out. The technique using the open disk resonator with whispering gallery modes was used. The character of the behavior of permittivity and loss tangent of materials is determined. Comparative analysis of the results is performed.
AbstractList Investigation of some dielectric and semiconductor materials in the millimeter waveband and temperature range from helium to room temperature is carried out. The technique using the open disk resonator with whispering gallery modes was used. The character of the behavior of permittivity and loss tangent of materials is determined. Comparative analysis of the results is performed.
Author Korzh, V. G.
Tarapov, S. I.
Golovashchenko, R. V.
Goroshko, O. V.
Derkach, V. N.
Author_xml – sequence: 1
  givenname: R. V.
  surname: Golovashchenko
  fullname: Golovashchenko, R. V.
  organization: Usikov Institute of Radiophysics and Electronics of the National Academy of Sciences of Ukraine 12, Ac. Proskura, Kharkov, 61085, Ukraine
– sequence: 2
  givenname: O. V.
  surname: Goroshko
  fullname: Goroshko, O. V.
  organization: Usikov Institute of Radiophysics and Electronics of the National Academy of Sciences of Ukraine 12, Ac. Proskura, Kharkov, 61085, Ukraine
– sequence: 3
  givenname: V. N.
  surname: Derkach
  fullname: Derkach, V. N.
  email: derkach@ire.kharkov.ua
  organization: Usikov Institute of Radiophysics and Electronics of the National Academy of Sciences of Ukraine 12, Ac. Proskura, Kharkov, 61085, Ukraine
– sequence: 4
  givenname: V. G.
  surname: Korzh
  fullname: Korzh, V. G.
  organization: Usikov Institute of Radiophysics and Electronics of the National Academy of Sciences of Ukraine 12, Ac. Proskura, Kharkov, 61085, Ukraine
– sequence: 5
  givenname: S. I.
  surname: Tarapov
  fullname: Tarapov, S. I.
  organization: Usikov Institute of Radiophysics and Electronics of the National Academy of Sciences of Ukraine 12, Ac. Proskura, Kharkov, 61085, Ukraine
BookMark eNp9jLFuwjAYhI0KUgvkCbr4BSolmDjxXBW1e3dk7AsYEjv8diohXr5p1KFTb7k73adbsrkPHjOWqapWUgpRirJSD1MvtmVV5XUtikeWxXjOR0mp1FY-sfuH_0JM7qiTC56Hhid0PUingcC1t7whXAd4c-MWPbwdI-IPaB1amETOcHPSpE0CufHKTOthaC9_kDh9RXTOBG8HkwLFNVs0uo3Ifn3Fnndvn6_vLw7AvifXabrtZS7VpijE_-s3skhQRw
ContentType Conference Proceeding
DBID 6IE
6IL
CBEJK
RIE
RIL
DatabaseName IEEE Electronic Library (IEL) Conference Proceedings
IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume
IEEE Xplore All Conference Proceedings
IEEE Electronic Library Online
IEEE Proceedings Order Plans (POP All) 1998-Present
DatabaseTitleList
Database_xml – sequence: 1
  dbid: RIE
  name: IEEE Electronic Library Online
  url: http://ieeexplore.ieee.org/Xplore/DynWel.jsp
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
EISBN 9789663353579
9663353570
9789663353562
9663353562
EndPage 923
ExternalDocumentID 6069211
Genre orig-research
GroupedDBID 6IE
6IF
6IK
6IL
6IN
AAJGR
ALMA_UNASSIGNED_HOLDINGS
BEFXN
BFFAM
BGNUA
BKEBE
BPEOZ
CBEJK
IEGSK
IERZE
OCL
RIE
RIL
ID FETCH-ieee_primary_60692113
IEDL.DBID RIE
ISBN 9781457708831
1457708833
IngestDate Wed Jun 26 19:28:22 EDT 2024
IsPeerReviewed false
IsScholarly false
Language English
LinkModel DirectLink
MergedId FETCHMERGED-ieee_primary_60692113
ParticipantIDs ieee_primary_6069211
PublicationCentury 2000
PublicationDate 2011-Sept.
PublicationDateYYYYMMDD 2011-09-01
PublicationDate_xml – month: 09
  year: 2011
  text: 2011-Sept.
PublicationDecade 2010
PublicationTitle 2011 21st International Crimean Conference "Microwave & Telecommunication Technology"
PublicationTitleAbbrev CRMICO
PublicationYear 2011
Publisher IEEE
Publisher_xml – name: IEEE
SSID ssj0000669946
Score 3.0028048
Snippet Investigation of some dielectric and semiconductor materials in the millimeter waveband and temperature range from helium to room temperature is carried out....
SourceID ieee
SourceType Publisher
StartPage 922
SubjectTerms Dielectrics
Materials
Permittivity
Resonant frequency
Temperature distribution
Whispering gallery modes
Title Investigation of temperature and frequency dependences of dielectric characteristics of bulk dielectrics and semiconductors
URI https://ieeexplore.ieee.org/document/6069211
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://sdu.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV1LSwMxEB5sT55UWlGrkoNHV_fRTTZnbelJBD14K5tkFoqSyK57EP-8mey2ttCLtzyGZGAgM0zm-wbgxqjYYCZ0xI3Ooqm3cKSqWER5VfLKKCnihIDCixfx9FY8zogm53aDhUHEUHyGdzQMf_nG6ZZSZfc-2JYpAXkHQhYdVmuTT_GuU8opD9itXIiYmuiuKZ36ebLTQSU4kPnR_64-hvEfEo89b3zMCRygHcHPFjmGs8xVjAimenZkVlrDqrqrkP5m6ya3_jkgQbPq-t6sNNO7VM20q9qP9y2RJpzVUPm8s8QL6-pmDJP57PVhEZHyy8-Oq2LZ652dwtA6i2fAfEiVK8k1zxLjPRgWCkuelmmuYq05inMY7TvhYv_yBA67LCtVXV3C8Ktu8QoGjWmvg31-ARu_mUM
link.rule.ids 310,311,782,786,791,792,798,54767
linkProvider IEEE
linkToHtml http://sdu.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV1LS8NAEB60HvSk0opaH3vwaDTP3easLRFrEezBW8g-AkXJlsQcxD_vziaNLfTibR_D7sDAzjA73zcAN5K7UgVMOFSKwAmNhR2eu8yJ8ozmksfM9RAonLyx2fvocYw0ObcdFkYpZYvP1B0O7V--1KLGVNm9CbZjH4G8e1HIKGvQWl1GxTjPOA6pRW9FjLnYRndF6tTOvY0eKtaFTA7_d_kRDP6weOS18zLHsKOKPvys0WPoguicIMVUy49MskKSvGxqpL_Jqs2teRBQUC6azjcLQcQmWTPu8vrzY02ksmdVWECvC2SG1WU1gOFkPH9IHFQ-XTZsFWmrd3ACvUIX6hSICaoiHlNBA08aH6ZGXGXUz_yIu0JQxc6gv-2E8-3L17CfzF-m6fRp9jyEgybnijVYF9D7Kmt1CbuVrK-srX4BVX-clA
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Abook&rft.genre=proceeding&rft.title=2011+21st+International+Crimean+Conference+%22Microwave+%26+Telecommunication+Technology%22&rft.atitle=Investigation+of+temperature+and+frequency+dependences+of+dielectric+characteristics+of+bulk+dielectrics+and+semiconductors&rft.au=Golovashchenko%2C+R.+V.&rft.au=Goroshko%2C+O.+V.&rft.au=Derkach%2C+V.+N.&rft.au=Korzh%2C+V.+G.&rft.date=2011-09-01&rft.pub=IEEE&rft.isbn=9781457708831&rft.spage=922&rft.epage=923&rft.externalDocID=6069211
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=9781457708831/lc.gif&client=summon&freeimage=true
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=9781457708831/mc.gif&client=summon&freeimage=true
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=9781457708831/sc.gif&client=summon&freeimage=true