Investigation of temperature and frequency dependences of dielectric characteristics of bulk dielectrics and semiconductors

Investigation of temperature and frequency dependences of dielectric characteristics of bulk dielectrics and semiconductors

Investigation of some dielectric and semiconductor materials in the millimeter waveband and temperature range from helium to room temperature is carried out. The technique using the open disk resonator with whispering gallery modes was used. The character of the behavior of permittivity and loss tan...

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Bibliographic Details
Published in:2011 21st International Crimean Conference "Microwave & Telecommunication Technology" pp. 922 - 923
Main Authors: Golovashchenko, R. V., Goroshko, O. V., Derkach, V. N., Korzh, V. G., Tarapov, S. I.
Format: Conference Proceeding
Language:English
Published: IEEE 01-09-2011
Subjects:
Dielectrics
Materials
Permittivity
Resonant frequency
Temperature distribution
Whispering gallery modes
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Summary:Investigation of some dielectric and semiconductor materials in the millimeter waveband and temperature range from helium to room temperature is carried out. The technique using the open disk resonator with whispering gallery modes was used. The character of the behavior of permittivity and loss tangent of materials is determined. Comparative analysis of the results is performed.
ISBN:9781457708831
1457708833