Identification of Installation Defects on MV Cable Systems Through on Field PD Measurements Performed with the Aid of NPF Voltage Source

This study explores partial discharge (PD) phenomena observed during Near-Power-Frequency (NPF) voltage source tests conducted on 35 kV medium voltage (MV) cable circuits. The research aims to understand how test voltage impacts the occurrence of PDs in the presence of defects on the semiconductor l...

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Bibliographic Details
Published in:2024 IEEE 5th International Conference on Dielectrics (ICD) pp. 1 - 4
Main Authors: Madonia, Antonino, Rizzo, Giuseppe
Format: Conference Proceeding
Language:English
Published: IEEE 30-06-2024
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Summary:This study explores partial discharge (PD) phenomena observed during Near-Power-Frequency (NPF) voltage source tests conducted on 35 kV medium voltage (MV) cable circuits. The research aims to understand how test voltage impacts the occurrence of PDs in the presence of defects on the semiconductor layer of MV terminals. Furthermore, the study utilizes simulations to evaluate the distribution of the electric field across the semiconducting layer and its relationship with the initiation of partial discharge phenomena.
ISSN:2834-8311
DOI:10.1109/ICD59037.2024.10613287