Composition and optical properties of amorphous a-Si[O.sub.x]: H films with silicon nanoclusters

The phase composition and optical properties of hydrogenated amorphous films of silicon suboxide (a-Si[O.sub.x]:H) with silicon nanoclusters are studied. Ultrasoft X-ray emission spectroscopy show that silicon- suboxide films with various oxidation states and various amorphous silicon-cluster conten...

Full description

Saved in:
Bibliographic Details
Published in:Semiconductors (Woodbury, N.Y.) p. 212
Main Authors: Terekhov, V.A, Terukov, E.I, Undalov, Yu. K, Parinova, E.V, Spirin, D.E, Seredin, P.V, Minakov, D.A, Domashevskaya, E.P
Format: Journal Article
Language:English
Published: Springer 01-02-2016
Subjects:
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Abstract The phase composition and optical properties of hydrogenated amorphous films of silicon suboxide (a-Si[O.sub.x]:H) with silicon nanoclusters are studied. Ultrasoft X-ray emission spectroscopy show that silicon- suboxide films with various oxidation states and various amorphous silicon-cluster contents can be grown using dc discharge modulation. In films with an ncl-Si content of ~50%, the optical-absorption edge is observed, whose extrapolation yields an optical band gap estimate of ~3.2-3.3 eV. In the visible region, rather intense photoluminescence bands are observed, whose peak positions indicate the formation of silicon nanoclusters 2.5-4.7 nm in size in these films, depending on the film composition. DOI: 10.1134/S1063782616020251
AbstractList The phase composition and optical properties of hydrogenated amorphous films of silicon suboxide (a-Si[O.sub.x]:H) with silicon nanoclusters are studied. Ultrasoft X-ray emission spectroscopy show that silicon- suboxide films with various oxidation states and various amorphous silicon-cluster contents can be grown using dc discharge modulation. In films with an ncl-Si content of ~50%, the optical-absorption edge is observed, whose extrapolation yields an optical band gap estimate of ~3.2-3.3 eV. In the visible region, rather intense photoluminescence bands are observed, whose peak positions indicate the formation of silicon nanoclusters 2.5-4.7 nm in size in these films, depending on the film composition. DOI: 10.1134/S1063782616020251
Audience Academic
Author Spirin, D.E
Minakov, D.A
Undalov, Yu. K
Terukov, E.I
Parinova, E.V
Domashevskaya, E.P
Terekhov, V.A
Seredin, P.V
Author_xml – sequence: 1
  fullname: Terekhov, V.A
– sequence: 2
  fullname: Terukov, E.I
– sequence: 3
  fullname: Undalov, Yu. K
– sequence: 4
  fullname: Parinova, E.V
– sequence: 5
  fullname: Spirin, D.E
– sequence: 6
  fullname: Seredin, P.V
– sequence: 7
  fullname: Minakov, D.A
– sequence: 8
  fullname: Domashevskaya, E.P
BookMark eNqVjEFOwzAQRb0oEi1wAHZzgQQ7TtKKHapA3bEoO4RaN53QQY7H8jiC45NIXAD9xZee9N5KLQIHVOre6NIYWz_sjW7telO1ptWVrhqzUMsZFTO7ViuRL62N2TT1Uh23PEQWysQBXDgDx0yd8xATR0yZUIB7cAOneOFRwBV7en8tZTyVPx-PsIOe_CDwTfkCQp66qRNc4M6PkjHJrbrqnRe8-_sbVb48v213xafzeKDQc06um3bGYZZx6uHhqa4b264ba-2_hV_3RVO3
ContentType Journal Article
Copyright COPYRIGHT 2016 Springer
Copyright_xml – notice: COPYRIGHT 2016 Springer
DOI 10.1134/S1063782616020251
DatabaseTitleList
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
Physics
ExternalDocumentID A445367533
GroupedDBID -5F
-5G
-BR
-EM
-~C
-~X
.VR
06D
0R~
0VY
123
1N0
29~
2J2
2JN
2JY
2KG
2KM
2LR
2~H
30V
4.4
408
40D
40E
5VS
6NX
8TC
8UJ
95-
95.
95~
96X
AAAVM
AABHQ
AACDK
AAHNG
AAIAL
AAJBT
AAJKR
AANZL
AARTL
AASML
AATNV
AATVU
AAUYE
AAWCG
AAYIU
AAYQN
AAYTO
AAYZH
ABAKF
ABBBX
ABDBF
ABDZT
ABECU
ABFTD
ABFTV
ABHLI
ABHQN
ABJNI
ABJOX
ABKCH
ABKTR
ABMNI
ABMQK
ABNWP
ABQBU
ABSXP
ABTEG
ABTHY
ABTKH
ABTMW
ABWNU
ABXPI
ACAOD
ACDTI
ACGFS
ACHSB
ACHXU
ACKNC
ACMDZ
ACMLO
ACOKC
ACOMO
ACZOJ
ADHHG
ADHIR
ADINQ
ADKNI
ADKPE
ADRFC
ADTPH
ADURQ
ADYFF
ADZKW
AEBTG
AEFQL
AEGAL
AEGNC
AEJHL
AEJRE
AEKMD
AEMSY
AENEX
AEOHA
AEPYU
AETLH
AEVLU
AEXYK
AFBBN
AFLOW
AFQWF
AFWTZ
AFZKB
AGAYW
AGDGC
AGJBK
AGMZJ
AGQMX
AGRTI
AGWIL
AGWZB
AGYKE
AHAVH
AHBYD
AHSBF
AHYZX
AIAKS
AIGIU
AIIXL
AILAN
AITGF
AJBLW
AJRNO
ALMA_UNASSIGNED_HOLDINGS
ALWAN
AMKLP
AMXSW
AMYLF
AMYQR
AOCGG
ARMRJ
ASPBG
AVWKF
AXYYD
AZFZN
B-.
B0M
BA0
BDATZ
BGNMA
CS3
CSCUP
DDRTE
DNIVK
DPUIP
DU5
EAD
EAP
EAS
EBLON
EBS
EIOEI
EJD
EMK
EPL
ESBYG
EST
ESX
FEDTE
FERAY
FFXSO
FIGPU
FINBP
FNLPD
FRRFC
FSGXE
FWDCC
GGCAI
GGRSB
GJIRD
GNWQR
GQ6
GQ7
H13
HF~
HG6
HMJXF
HRMNR
HVGLF
HZ~
I-F
IAO
IJ-
IKXTQ
ITC
IWAJR
IXD
I~X
I~Z
J-C
JBSCW
JZLTJ
KOV
L8X
LLZTM
M4Y
MA-
NB0
NPVJJ
NQJWS
NU0
O93
O9J
P2P
P9T
PF0
PT4
QOS
R89
R9I
RIG
RNS
ROL
RSV
S16
S27
S3B
SAP
SDH
SHX
SISQX
SJYHP
SNE
SNPRN
SNX
SOHCF
SOJ
SPH
SPISZ
SRMVM
SSLCW
STPWE
SZN
T13
TSG
TUC
TUS
UG4
UOJIU
UTJUX
UZXMN
VC2
VFIZW
W23
W48
WK8
XU3
YLTOR
Z7R
Z7S
Z7V
Z7X
Z7Y
Z7Z
Z83
Z88
ZMTXR
~8M
~A9
ID FETCH-gale_infotracacademiconefile_A4453675333
ISSN 1063-7826
IngestDate Tue Nov 12 23:28:26 EST 2024
IsPeerReviewed true
IsScholarly true
Language English
LinkModel OpenURL
MergedId FETCHMERGED-gale_infotracacademiconefile_A4453675333
ParticipantIDs gale_infotracacademiconefile_A445367533
PublicationCentury 2000
PublicationDate 20160201
PublicationDateYYYYMMDD 2016-02-01
PublicationDate_xml – month: 02
  year: 2016
  text: 20160201
  day: 01
PublicationDecade 2010
PublicationTitle Semiconductors (Woodbury, N.Y.)
PublicationYear 2016
Publisher Springer
Publisher_xml – name: Springer
SSID ssj0011854
Score 4.1498055
Snippet The phase composition and optical properties of hydrogenated amorphous films of silicon suboxide (a-Si[O.sub.x]:H) with silicon nanoclusters are studied....
SourceID gale
SourceType Aggregation Database
StartPage 212
SubjectTerms Analysis
Optical properties
Photoluminescence
Silicon
Title Composition and optical properties of amorphous a-Si[O.sub.x]: H films with silicon nanoclusters
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://sdu.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwtV3fT8IwEG4UYqIPRlHj7_RB4oMZwrrh8G3KDE9qAirEGCzdFgmwEmDGP9-7rW5DfcAHX5bl0q5L79vt6931SsgJrwqXuz1Ls0yfa4ZrVTX4jzPNq4lerWf1dCM6taTRvLhtW3XHcNJc1VT2r5oGGegad87-QdvJQ0EA96BzuILW4bqQ3vEDV4lYUWBAjmNv9Ri97hMsnxqF_kcSJhjTX7nW7BfNq7voMKyPollHH0ED6zWN1M63aX8IcAnOAh5IMQyxssI0y2mbmF8vAywciyf3AGV9kjIJ0CdbuZSHwJt4gzf5HuXXluyMOBzEUqeUOHIfApcPY2knLKUe2XtY4ONhrnHzx6znopIkO3_zXGasL_AlDSjLvEXVf7f0zMBYM3bBHpUq8F5d1a6dL6BtG4bJYF3E2DLJ62CPwBzm7XanU0_CTUBaovSDr_FV-BvGOP8xgvp3Z1hIa4Osq-UDtWO9b5IlLyiQtUxRyQJZiZJ6xXSLvGawQAELVGGBplig0qcJFihi4Vkh4eWSNmiEAooooAoFNIuCbVK6cVrXDQ1ftYsTN5twwdWWCxl4WPWrm84M2yG5AMS7hPrCFGXGOatxYHd-meuiUnUtXweu6jPh7pHTBR-6v3DLA7KaAuSQ5GaT0Dsiy1M3PFaq-gRokFrJ
link.rule.ids 315,782,786,27933,27934
linkProvider Springer Nature
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Composition+and+optical+properties+of+amorphous+a-Si%5BO.sub.x%5D%3A+H+films+with+silicon+nanoclusters&rft.jtitle=Semiconductors+%28Woodbury%2C+N.Y.%29&rft.au=Terekhov%2C+V.A&rft.au=Terukov%2C+E.I&rft.au=Undalov%2C+Yu.+K&rft.au=Parinova%2C+E.V&rft.date=2016-02-01&rft.pub=Springer&rft.issn=1063-7826&rft.spage=212&rft_id=info:doi/10.1134%2FS1063782616020251&rft.externalDocID=A445367533
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=1063-7826&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=1063-7826&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=1063-7826&client=summon