IP determination and 1+1 REMPI spectrum of SiO at 210-220 nm with implications for SiO$^{+}$ ion trap loading
Journal of Molecular Spectroscopy Volume 355, January 2019, Pages 40-45 The 1+1 REMPI spectrum of SiO in the 210-220 nm range is recorded. Observed bands are assigned to the $A-X$ vibrational bands $(v``=0-3, v`=5-10)$ and a tentative assignment is given to the 2-photon transition from $X$ to the n=...
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| Abstract | Journal of Molecular Spectroscopy Volume 355, January 2019, Pages
40-45 The 1+1 REMPI spectrum of SiO in the 210-220 nm range is recorded. Observed
bands are assigned to the $A-X$ vibrational bands $(v``=0-3, v`=5-10)$ and a
tentative assignment is given to the 2-photon transition from $X$ to the
n=12-13 $[X^{2}{\Sigma}^{+},v^{+}=1]$ Rydberg states at 216-217 nm. We estimate
the IP of SiO to be 11.59(1) eV. The SiO$^{+}$ cation has previously been
identified as a molecular candidate amenable to laser control. Our work allows
us to identify an efficient method for loading cold SiO$^{+}$ from an ablated
sample of SiO into an ion trap via the $(5,0)$ $A-X$ band at 213.977 nm. |
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| AbstractList | Journal of Molecular Spectroscopy Volume 355, January 2019, Pages
40-45 The 1+1 REMPI spectrum of SiO in the 210-220 nm range is recorded. Observed
bands are assigned to the $A-X$ vibrational bands $(v``=0-3, v`=5-10)$ and a
tentative assignment is given to the 2-photon transition from $X$ to the
n=12-13 $[X^{2}{\Sigma}^{+},v^{+}=1]$ Rydberg states at 216-217 nm. We estimate
the IP of SiO to be 11.59(1) eV. The SiO$^{+}$ cation has previously been
identified as a molecular candidate amenable to laser control. Our work allows
us to identify an efficient method for loading cold SiO$^{+}$ from an ablated
sample of SiO into an ion trap via the $(5,0)$ $A-X$ band at 213.977 nm. |
| Author | Stollenwerk, Patrick R Antonov, Ivan O Odom, Brian C |
| Author_xml | – sequence: 1 givenname: Patrick R surname: Stollenwerk fullname: Stollenwerk, Patrick R – sequence: 2 givenname: Ivan O surname: Antonov fullname: Antonov, Ivan O – sequence: 3 givenname: Brian C surname: Odom fullname: Odom, Brian C |
| BackLink | https://doi.org/10.1016/j.jms.2018.11.008$$DView published paper (Access to full text may be restricted) https://doi.org/10.48550/arXiv.1710.08905$$DView paper in arXiv |
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| Snippet | Journal of Molecular Spectroscopy Volume 355, January 2019, Pages
40-45 The 1+1 REMPI spectrum of SiO in the 210-220 nm range is recorded. Observed
bands are... |
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| SubjectTerms | Physics - Atomic Physics |
| Title | IP determination and 1+1 REMPI spectrum of SiO at 210-220 nm with implications for SiO$^{+}$ ion trap loading |
| URI | https://arxiv.org/abs/1710.08905 |
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