Spectroscopic ellipsometry study of N super(+) ion-implanted ethylene-norbornene films

• Published in: Radiation physics and chemistry (Oxford, England : 1993) Vol. 98; pp. 7 - 13
• Main Authors: Siljegovie, M, Kacarevic-Popovic, Z M, Stchakovsky, M, Radosavljevic, A N, Korica, S, Novakovic, M, Popovic, M
• Format: Journal Article
• Language: English
• Published: 01-05-2014
• Subjects: Dispersions; Electronics; Ellipsometry; Energy distribution; Energy gap; Fluence; Mathematical models; Spectroscopy
• ISSN: 0969-806X
• DOI: 10.1016/j.radphyschem.2013.12.023

The optical properties of 150 keV N super(+) implanted ethylene-norbornene (TOPAS 6017S-04) copolymer were investigated using phase modulated spectroscopic ellipsometry (PMSE) and ultraviolet-visible (UV-Vis) spectroscopy in the ranges of 0.6-6.5 eV and of 1.5-6.2 eV, respectively. The single-effective-oscillator model was used to fit the calculated data to the experimental ellipsometric spectra. The results show that the oscillator and dispersion energies decrease with increasing ion fluence up to 10 super(15) cm super(-2), and then these parameters increase with further fluence increasing. Analysis of the UV-Vis absorption spectra revealed the presence of indirect electronic transitions with the band gap energy in the range of 1.3 to 2.8 eV. It was found that both the band gap energy and the energy width of the distribution of localized band tail states decrease, while the values of Tauc coefficient increase with increasing the ion fluence. From the ellipsometric data we found that the real part of the dielectric function increased about 7% after irradiation with 10 super(15) cm super(-2), and decreased about 10% in samples modified with 10 super(16)cm super(-2).