Three-dimensional imaging of adherent cells using FIB/SEM and STEM

In this chapter we describe three different approaches for three-dimensional imaging of electron microscopic samples: serial sectioning transmission electron microscopy (TEM), scanning transmission electron microscopy (STEM) tomography, and focused ion beam/scanning electron microscopy (FIB/SEM) tom...

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Bibliographic Details

Published in:	Methods in molecular biology (Clifton, N.J.) Vol. 1117; p. 617
Main Authors:	Villinger, Clarissa, Schauflinger, Martin, Gregorius, Heiko, Kranz, Christine, Höhn, Katharina, Nafeey, Soufi, Walther, Paul
Format:	Journal Article
Language:	English
Published:	United States 01-01-2014
Subjects:	Cell Culture Techniques Cells, Cultured Electron Microscope Tomography - methods Histocytological Preparation Techniques Image Processing, Computer-Assisted Imaging, Three-Dimensional Microscopy, Electron, Scanning Transmission - methods Software
Online Access:	Get more information
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