Evidence for the influence of interfacial atomic structure on electrical properties at the epitaxial CaF2/Si(111) interface

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Bibliographic Details
Published in:	Physical review letters Vol. 60; no. 14; pp. 1394 - 1397
Main Authors:	BATSTONE, J. L, PHILLIPS, J. M, HUNKE, E. C
Format:	Journal Article
Language:	English
Published:	Ridge, NY American Physical Society 04-04-1988
Subjects:	Condensed matter: structure, mechanical and thermal properties Exact sciences and technology Physics Solid surfaces and solid-solid interfaces Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) High resolution Annealing Electrical properties Epitaxy Solid solid interface Experimental study Inorganic compound Thin film Interface structure Transmission electron microscopy Binding mode Property structure relationship Silicon Calcium Fluorides Lattice image
Online Access:	Get full text
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Description
Bibliography:	ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 23
ISSN:	0031-9007 1079-7114
DOI:	10.1103/PhysRevLett.60.1394