Improvements in SIMS continue Is the end in sight?

Saved in:
Bibliographic Details
Published in:Applied surface science Vol. 252; no. 19; pp. 6836 - 6843
Main Authors: WINOGRAD, Nicholas, POSTAWA, Zbigniew, JUAN CHENG, SZAKAL, Christopher, KOZOLE, Joseph, GARRISON, Barbara J
Format: Conference Proceeding
Language:English
Published: Amsterdam Elsevier Science 30-07-2006
Subjects:
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Author WINOGRAD, Nicholas
JUAN CHENG
GARRISON, Barbara J
SZAKAL, Christopher
KOZOLE, Joseph
POSTAWA, Zbigniew
Author_xml – sequence: 1
  givenname: Nicholas
  surname: WINOGRAD
  fullname: WINOGRAD, Nicholas
  organization: Department of Chemistry, Perm State University, University Park, PA 16802, United States
– sequence: 2
  givenname: Zbigniew
  surname: POSTAWA
  fullname: POSTAWA, Zbigniew
  organization: Smoluchowski Institute of Physics, Jagiellonian University, Krakow, Poland
– sequence: 3
  surname: JUAN CHENG
  fullname: JUAN CHENG
  organization: Department of Chemistry, Perm State University, University Park, PA 16802, United States
– sequence: 4
  givenname: Christopher
  surname: SZAKAL
  fullname: SZAKAL, Christopher
  organization: Department of Chemistry, Perm State University, University Park, PA 16802, United States
– sequence: 5
  givenname: Joseph
  surname: KOZOLE
  fullname: KOZOLE, Joseph
  organization: Department of Chemistry, Perm State University, University Park, PA 16802, United States
– sequence: 6
  givenname: Barbara J
  surname: GARRISON
  fullname: GARRISON, Barbara J
  organization: Department of Chemistry, Perm State University, University Park, PA 16802, United States
BackLink http://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=18102987$$DView record in Pascal Francis
BookMark eNotj0FLwzAYhoNMsJv-Aw-9eGz9viRtk5PI0FmYeJieR5J-cR1rWppO8N9b0dNzeB5eeJdsEfpAjN0i5AhY3h9zM8RzdDkHKHPgOUp-wRJUlciKQskFS-ZMZ1IIfsWWMR4BkM82YbzuhrH_oo7CFNM2pLv6dZe6PkxtOFNax3Q6UEqh-XWx_TxMD9fs0ptTpJt_rtjH89P7-iXbvm3q9eM2G1AVU2Ykh6r0SipdobJWG0OmoLKxSjdKAjpbcA3OKwsgjAekSpOw4DVpco1Ysbu_3cFEZ05-NMG1cT-MbWfG7z0qBK7nEz8_60qJ
ContentType Conference Proceeding
Copyright 2006 INIST-CNRS
Copyright_xml – notice: 2006 INIST-CNRS
DBID IQODW
DOI 10.1016/j.apsusc.2006.02.142
DatabaseName Pascal-Francis
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
Physics
EISSN 1873-5584
EndPage 6843
ExternalDocumentID 18102987
GroupedDBID --K
--M
-~X
.~1
0R~
1B1
1RT
1~.
1~5
23M
4.4
457
4G.
5GY
5VS
6J9
7-5
71M
8P~
9JN
AABNK
AABXZ
AACTN
AAEDT
AAEDW
AAEPC
AAIAV
AAIKJ
AAKOC
AALRI
AAOAW
AAPBV
AAQFI
AAQXK
AARLI
AAXUO
ABFNM
ABFRF
ABMAC
ABNEU
ABPIF
ABPTK
ABXDB
ABXRA
ABYKQ
ACBEA
ACDAQ
ACFVG
ACGFO
ACGFS
ACNNM
ACRLP
ADBBV
ADECG
ADEZE
ADMUD
AEBSH
AEFWE
AEKER
AENEX
AEZYN
AFKWA
AFTJW
AFZHZ
AGHFR
AGUBO
AGYEJ
AHHHB
AIEXJ
AIKHN
AITUG
AIVDX
AJBFU
AJOXV
AJSZI
ALMA_UNASSIGNED_HOLDINGS
AMFUW
AMRAJ
ASPBG
AVWKF
AXJTR
AZFZN
BBWZM
BKOJK
BLXMC
CS3
EBS
EFJIC
EJD
EO8
EO9
EP2
EP3
F5P
FDB
FEDTE
FGOYB
FIRID
FLBIZ
FNPLU
FYGXN
G-2
G-Q
GBLVA
HMV
HZ~
IHE
IQODW
J1W
KOM
M24
M38
M41
MAGPM
MO0
N9A
NDZJH
O-L
O9-
OAUVE
OGIMB
OZT
P-8
P-9
P2P
PC.
Q38
R2-
RIG
RNS
ROL
RPZ
SCB
SDF
SDG
SDP
SES
SEW
SMS
SPC
SPCBC
SPD
SPG
SSK
SSM
SSQ
SSZ
T5K
TN5
VOH
WH7
WUQ
XFK
XPP
ZMT
~02
~G-
ID FETCH-LOGICAL-p185t-a42076f8489718bb9aaea5e6db89d8401cb5290cf8b003af01e79e3b0f9e9ecd3
ISSN 0169-4332
IngestDate Sun Oct 29 17:08:01 EDT 2023
IsPeerReviewed true
IsScholarly true
Issue 19
Keywords SIMS
SF5
ToF-SIMS
C60
Cluster ion
Au3
Language English
License CC BY 4.0
LinkModel OpenURL
MeetingName Proceedings of the Fifteenth International Conference on Secondary Ion Mass Spectrometry, SIMS XV, The University of Manchester, UK, September 12-16, 2005
MergedId FETCHMERGED-LOGICAL-p185t-a42076f8489718bb9aaea5e6db89d8401cb5290cf8b003af01e79e3b0f9e9ecd3
PageCount 8
ParticipantIDs pascalfrancis_primary_18102987
PublicationCentury 2000
PublicationDate 2006-07-30
PublicationDateYYYYMMDD 2006-07-30
PublicationDate_xml – month: 07
  year: 2006
  text: 2006-07-30
  day: 30
PublicationDecade 2000
PublicationPlace Amsterdam
PublicationPlace_xml – name: Amsterdam
PublicationTitle Applied surface science
PublicationYear 2006
Publisher Elsevier Science
Publisher_xml – name: Elsevier Science
SSID ssj0012873
Score 2.1421294
SourceID pascalfrancis
SourceType Index Database
StartPage 6836
SubjectTerms Condensed matter: electronic structure, electrical, magnetic, and optical properties
Condensed matter: structure, mechanical and thermal properties
Cross-disciplinary physics: materials science; rheology
Exact sciences and technology
Physics
Title Improvements in SIMS continue Is the end in sight?
Volume 252
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://sdu.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwtV3NT9swFLdK0aRxAsa0MUA5cEOZ2jiJ7dMUrYUGUEFrUdEuyHacqRxCRdr_f892nZoWCXHgEkVOlCh5P7_vD4ROlaQlT-NuSHAiwECRSUg502ddRWPBBTOzCAYjMrynvX7cb7XcpMzV2odSGtaA1rpy9h3Ubh4KC3AONIcjUB2Om3R_Vfw4xbJePJdcd5C129cHh3UlKFveNoUdnoM9r7PWp9VCneW1TfUwfZnOamO-4yYDeJIPby7-ZL0ljrRt3OjltzejcTbJTMRDTP9VXtjh8i4b6gYMw2aY1-hvdpVdr3U4WPdCEBdQMa4xVx4z8j5p6bFMmS7LsixXWS5LCQ6TxM6Gc2w4SiIfb8zjqinFqSehU2o7O21wf-uIePzJZ7UeEmcjTREIg2gl7VyEf00INqmJoPHorvRkC22bqfFttJ3l_fvLJjQFJia2DePtd7l6TJM0uPlmnWzLa9hvpR2U4mkv4110sKrrDG4byOyhlqr20Y7XknIffTIpwbL-giIfJMG0CjRIAgeSIK8DAEkAINHXDEh-HaC78_749yBcTtgIZ6CnzUMeRx2SljSmDHQUIRjniicqLQRlBZj-XSmSiHVkSTX35yVsYMIUFp2SKaZkgb-idvVUqW8oIIUkmMRcwkNiFgk9xLojiaICF0WRpN_RyYv_8DCz3VQe3A8_fOuGH-jzCnlHqD1_XqhjtFUXi5Mljf4DGZVgdA
link.rule.ids 310,311,782,786,791,792,23939,23940,25149,27934
linkProvider Elsevier
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=proceeding&rft.title=Applied+surface+science&rft.atitle=Improvements+in+SIMS+continue+Is+the+end+in+sight%3F&rft.au=WINOGRAD%2C+Nicholas&rft.au=POSTAWA%2C+Zbigniew&rft.au=JUAN+CHENG&rft.au=SZAKAL%2C+Christopher&rft.date=2006-07-30&rft.pub=Elsevier+Science&rft.issn=0169-4332&rft.eissn=1873-5584&rft.volume=252&rft.issue=19&rft.spage=6836&rft.epage=6843&rft_id=info:doi/10.1016%2Fj.apsusc.2006.02.142&rft.externalDBID=n%2Fa&rft.externalDocID=18102987
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0169-4332&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0169-4332&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0169-4332&client=summon