Surface impedance studies of PrT4Sb12 (T = Os, Ru)

RF surface impedance measurements Zs=Rs+iXs, where Rs and Xs are the surface resistance and surface reactance, respectively, were carried out for high-quality single crystals PrOs4Sb12 and PrRu4Sb12. In PrOs4Sb12, both Rs and Xs exhibit unusual field dependence with a significant suppression around...

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Bibliographic Details
Published in:Physica. B, Condensed matter Vol. 378-80; pp. 209 - 210
Main Authors: TOU, H, NAKAI, Y, DOI, M, SERA, M, SUGAWAR, H, SATO, H
Format: Conference Proceeding Journal Article
Language:English
Published: Amsterdam Elsevier 01-05-2006
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Summary:RF surface impedance measurements Zs=Rs+iXs, where Rs and Xs are the surface resistance and surface reactance, respectively, were carried out for high-quality single crystals PrOs4Sb12 and PrRu4Sb12. In PrOs4Sb12, both Rs and Xs exhibit unusual field dependence with a significant suppression around the AB phase boundary reported by the thermal conductivity measurements; Rs and Xs have a kink at 0.4Hc2. This feature is different markedly from those in PrRu4Sb12 which is reported to be a s-wave superconductor.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
ISSN:0921-4526
1873-2135
DOI:10.1016/j.physb.2006.01.078