Surface impedance studies of PrT4Sb12 (T = Os, Ru)
RF surface impedance measurements Zs=Rs+iXs, where Rs and Xs are the surface resistance and surface reactance, respectively, were carried out for high-quality single crystals PrOs4Sb12 and PrRu4Sb12. In PrOs4Sb12, both Rs and Xs exhibit unusual field dependence with a significant suppression around...
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Published in: | Physica. B, Condensed matter Vol. 378-80; pp. 209 - 210 |
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Main Authors: | , , , , , |
Format: | Conference Proceeding Journal Article |
Language: | English |
Published: |
Amsterdam
Elsevier
01-05-2006
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Subjects: | |
Online Access: | Get full text |
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Summary: | RF surface impedance measurements Zs=Rs+iXs, where Rs and Xs are the surface resistance and surface reactance, respectively, were carried out for high-quality single crystals PrOs4Sb12 and PrRu4Sb12. In PrOs4Sb12, both Rs and Xs exhibit unusual field dependence with a significant suppression around the AB phase boundary reported by the thermal conductivity measurements; Rs and Xs have a kink at 0.4Hc2. This feature is different markedly from those in PrRu4Sb12 which is reported to be a s-wave superconductor. |
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Bibliography: | ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 23 |
ISSN: | 0921-4526 1873-2135 |
DOI: | 10.1016/j.physb.2006.01.078 |